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Volume 120, Issue 1, Pages 121-130 (July 2010)


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The impact of a family history of psychosis on age-at-onset and positive and negative symptoms of schizophrenia: A meta-analysis

Michelle L. EsterbergaCorresponding Author Informationemail address, Hanan D. Trotmana, Carrie Holtzmana, Michael T. Comptonb, Elaine F. Walkera

Received 19 September 2009; received in revised form 15 January 2010; accepted 19 January 2010. published online 22 March 2010.

Abstract 

The results of research on the relation of family history (FH) of psychosis with clinical presentation in schizophrenia have been mixed. To date, there have been no comprehensive reviews that have examined this body of research. The current review quantitatively evaluates research on the relation of FH with two aspects of schizophrenia, age-at-onset and symptom presentation. Studies investigating the influence of a FH on age-at-onset (N=15 studies), age-at-onset and sex (N=12 studies), and/or positive (N=11 studies) and negative symptoms (N=12 studies) in patients with schizophrenia were included in the meta-analyses. Results showed that FH has a small but significant impact on age-at-onset as well as negative symptoms. Of most interest was the finding that sex differences in age-at-onset are not observed in samples with a FH. Furthermore, there was a significant interaction between FH and sex with respect to negative symptoms. The findings of the current review are discussed in light of the diathesis-stress model. Theoretical assumptions and empirical research are reviewed to support the notion that FH influences susceptibility and presentation through similar mechanisms. Implications of the current findings, limitations of the review, and directions for future research are highlighted.

a Emory University Graduate School of Arts and Sciences, Department of Psychology, 36 Eagle Row, Atlanta, Georgia 30322, United States

b Emory University School of Medicine, Department of Psychiatry and Behavioral Sciences, United States

Corresponding Author InformationCorresponding author. Tel.: +1 404 727 7547; fax: +1 404 727 1284.

PII: S0920-9964(10)00049-6

doi:10.1016/j.schres.2010.01.011


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